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Defects Activity Analysis Report

This document lists features of the Defects Activity Analysis Report.

defects activity analysis report in katalon testops

The Defects Activity Analysis Report provides a clear, time-based view of defect creation, closure, and accumulation trends across a selected period.

It helps QA and development teams track defect dynamics, identify backlog growth, and evaluate resolution performance over time.

Tutorial: View defect trends

Report Features​

The Defects Activity Analysis Report includes multiple visual components and metrics to help you analyze defect trends comprehensively.

Defects Activity Trend widget​

A hybrid stacked bar and line chart that visualizes:

  • Accumulated open defects: Active unresolved defects carried over time. It counts defects with created_at date within selected scope (time/iteration) and undefined resolved_at.
  • Created defects: Number of defects created during the selected time period. It counts defects with created_at date within selected scope (time/iteration).
  • Closed defects: Number of defects resolved during the selected time period. It counts defects with resolved_at date within selected scope (time/iteration).
Trend chart showing created, closed, and accumulated open defects

Defects Activity Summary widget​

A set of snapshot metrics summarizing total created and closed defects for the selected period.
These KPIs provide an at-a-glance view of current defect handling performance.

Open Defects Distribution by Priority widget​

Displays the proportion of defects by priority level (P1–P3). This chart helps highlight the concentration of critical or high-severity issues.

Pie chart showing defect distribution by priority

Defect Drill-down Table​

A detailed table listing all defect records that appear in the visualizations.
Each entry includes key fields such as:

  • Created At
  • Key (Defect ID)
  • Summary
  • Priority
  • Status
  • Closed Date
  • Assignee

You can click on any Defect Key to open details, assign owners, or escalate critical items.

Detailed table view of individual defect records
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